European Conference on Energy Dispersive X-Ray Spectrometry (EDXRS Conference) 2002

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Description

Event name
European Conference on Energy Dispersive X-Ray Spectrometry (EDXRS Conference) 2002
 
Event type
Event for scientific audience
 
Start date
17-06-2002
End date
21-06-2002
 
Location
Berlin
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Osmic, F. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, S. ; Fabry, L. Comparison of a Si drift detector with a Si(Li) detector in a TXRF spectrometer for wafer analysisPräsentation Presentation2002
2Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zamini, Shokufeh ; Zöger, N. Comparison of SR-TXRF excitation-detection geometries for samples with differing matricesPräsentation Presentation2002
3Wobrauschek, Peter ; Zöger, N. ; Pepponi, Giancarlo ; Streli, Christina ; Zamini, Shokufeh Differences in Pb and Ca concentrations in bone transition zones determined by SR-XRFPräsentation Presentation2002
4Wobrauschek, Peter ; Marosi, N. ; Streli, Christina Microanalysis with a polycapillary in a vacuum chamberPräsentation Presentation2002
5Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements at the PTB undulator beamline at BESSY II: analysis of Si wafer surfacesPräsentation Presentation2002
6Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3Präsentation Presentation2002
7Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Ulm, G. ; Streli, Christina TXRF-NEXAFS investigation of organic contamination on Si wafersPräsentation Presentation2002