TXRF Conference 2002

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Description

Event name
TXRF Conference 2002
 
Event type
Event for scientific audience
 
Start date
09-09-2002
End date
13-09-2002
 
Location
Funchal, Portugal
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-8 of 8 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Aiginger, H. ; Streli, Christina ; Wobrauschek, Peter 30 Years of TXRFPräsentation Presentation2002
2Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. ; Fabry, L. Analysis of intentionally contaminated Si Wafers with TXRF-NEXAFSPräsentation Presentation2002
3Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated WafersPräsentation Presentation2002
4Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF of low Z Elements at the PTB Undulator Beamline at BESSYPräsentation Presentation2002
5Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zamini, Shokufeh ; Zöger, N. Geometrical Optimization of SR-TXRF for Samples with different MatrixPräsentation Presentation2002
6Wobrauschek, Peter Improvement of Detection Limits by modern TXRF InstrumentationPräsentation Presentation2002
7Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Kanngießer, B. ; Malzer, W. ; Palmetshofer, L. Measurements of light Element Implants in Si Wafers with SR-TXRFPräsentation Presentation2002
8Streli, Christina TXRF of low Z Elements: Developments and ApplicationsPräsentation Presentation2002