6th Multinational Congress on Microscopy - European Extension

View Statistics Email Alert RSS Feed

Description

Event name
6th Multinational Congress on Microscopy - European Extension
 
Event type
Event for scientific audience
 
Start date
01-06-2003
End date
05-06-2003
 
Location
Pula, Croatia
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Hébert, Cécile ; Eisenmenger-Sittner, Christoph ; Schattschneider, Peter Application of the Virtual Crystal Approximation to Elnes Calculations: The Cu L₃ Edge in Cuni AlloysPräsentation Presentation2003
2Schattschneider, Peter ; Jouffrey, Bernard Energy Loss Spectrometry and Eftem - The Present Situation and Things to comePräsentation Presentation2003
3Schattschneider, Peter Localisation and Correlation in Low Energy LossesPräsentation Presentation2003
4Haas, Rüdiger ; Pongratz, Peter ; Degischer, Hans-Peter Microstructure and Phases in Stainless Steel Violin StringsPräsentation Presentation2003
5Stöger-Pollach, Michael ; Hébert, Cécile ; Schattschneider, Peter ; Zandbergen, H.W. ; Rau, B. ; Gall, S. SUB-eV Core Level Shifts in Si Grain Boundaries and NanotwinsPräsentation Presentation2003
6Stöger-Pollach, Michael ; Schattschneider, Peter ; Schneider, J. ; Gall, S. The Elnes Separation Applied to Oxidation states of InterfacesPräsentation Presentation2003
7Stöger-Pollach, Michael ; Schattschneider, Peter ; Hébert, Cécile ; Zandbergen, H.W. Unexplained Thickness Dependence in the Si Loss Function at 0.14 eV Energy ResolutionPräsentation Presentation2003