10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03)

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Description

Event name
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03)
 
Event type
Event for scientific audience
 
Start date
08-10-2003
Location
Berlin/D
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-6 of 6 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Jogl, Christian ; Werner, Wolfgang S.M. ; Störi, Herbert In situ XPS measurements of electrochemically prepared thin filmsPräsentation Presentation2003
2Smekal, Werner ; Werner, Wolfgang S.M. ; Fadley, C.S. ; van Hove, M.A. Influence of coherent scattering (diffraction) on the Depth Distribution Function (DDF) in XPS/AES on polycrystalline surfacesPräsentation Presentation2003
3Kolm, Ralph ; Foisner, J. ; Friedbacher, Gernot ; Kleiner, Robert ; Werner, Wolfgang S.M. ; Störi, Herbert Measurement of the C 1s electron mean free path in octadecylsiloxane thin films on silicon by means of angle resolved XPSPräsentation Presentation2003
4Werner, Wolfgang S.M. Obtaining Quantitative Information on Surface Excitations from Reflection Electron Energy Loss Spectra (REELS)Präsentation Presentation2003
5Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Simulation of Electron Spectra for Surface Analysis (SESSA)Präsentation Presentation2003
6Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Software Demonstration: Simulation of Electron Spectra for Surface Analysis (SESSA)Präsentation Presentation2003