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Record link: 
http://hdl.handle.net/20.500.12708/124399
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Title: 
In situ XPS measurements of electrochemically prepared thin films
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Citation: 
Jogl, C., Werner, W. S. M., & Störi, H. (2003). In situ XPS measurements of electrochemically prepared thin films. 10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA ’03), Berlin/D, Austria. http://hdl.handle.net/20.500.12708/124399
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Publication Type: 
Presentation - Conference presentation
en
Authors: 
Jogl, Christian 
Werner, Wolfgang S.M. 
Störi, Herbert 
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Organisational Unit: 
E134-01 - Forschungsbereich Applied and Computational Physics 
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Date (published): 
2003
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Event name: 
10th Europ. Conf. on Applied Surface and Interface Analysis (ECASIA '03) 
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Event date: 
8-Oct-2003
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Event place: 
Berlin/D, Austria
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Science Branch: 
Physik, Mechanik, Astronomie
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Appears in Collections:
Presentation

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