FIB 2001 Advances in Focused Ion Beam Microscopy
Event name
FIB 2001 Advances in Focused Ion Beam Microscopy
Event type
Event for scientific audience
Start date
30-03-2001
Location
Oxford, UK
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Wanzenböck, Heinz D. ; Bertagnolli, Emmerich ; Grabner, U. ; Pongratz, Peter | TEM-images for interface study of dielectrics deposited locally by a focused ion beam | Präsentation Presentation | 2001 |