International Conference on Extended Defects in Semiconductors 2008
Event name
International Conference on Extended Defects in Semiconductors 2008
Event type
Event for scientific audience
Start date
12-09-2008
End date
19-09-2008
Location
Futuroscope/Poitiers, France
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Pongratz, Peter ; Hyun, Youn Joo ; Ingstein, A. ; Bertagnolli, Emmerich | TEM analysis of extended defects in silicon whiskers and branched single crystalline GaAs/AlAs whiskers on Si nanowire trunks | Präsentation Presentation | 2008 |