International Conference on Extended Defects in Semiconductors 2008

Event name
International Conference on Extended Defects in Semiconductors 2008
 
Event type
Event for scientific audience
 
Start date
12-09-2008
End date
19-09-2008
 
Location
Poitiers
Country
France
 
Event format Veranstaltungsformat
On Site

Publications Publikationen



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PreviewAuthor(s)TitleTypeIssue Date
1Pongratz, Peter ; Hyun, Youn Joo ; Ingstein, A. ; Bertagnolli, Emmerich TEM analysis of extended defects in silicon whiskers and branched single crystalline GaAs/AlAs whiskers on Si nanowire trunksPräsentation Presentation2008