58th Denver X-ray Conference

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Description

Event name
58th Denver X-ray Conference
 
Event type
Event for scientific audience
 
Start date
27-07-2009
End date
31-07-2009
 
Location
Colorado Springs
Country
 
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-8 of 8 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Horntrich, C. ; Sasamori, S. ; Streli, Christina ; Meirer, F. ; Fittschen, U. ; Pepponi, Giancarlo ; Havrilla, G.J. Improvement Of Calibration Processes In Txrf Of Wafer Surface Analysis: Investigation Of Saturation Effects In Txrf By Comparing Picodroplets And MicrodropletsPräsentation Presentation2009
2Smolek, S. ; Streli, Christina ; Zöger, N. ; Wobrauschek, Peter ; Meirer, F. Micro X-Ray Fluorescence Spectrometer With Low Power Tube For Light Element AnalysisPräsentation Presentation2009
3Buzanich, G. ; Streli, Christina ; Wobrauschek, Peter ; Markowicz, A. ; Wegrzynek, D. ; Chinea-Cano, Ernesto ; Griesser, M. ; Uhlir, K. Part Ii (portable Art Analyzer) - Development Of A Portablemicro X-Ray Fluorescence Spectrometer Adapted For The Special Needs For The Study Of Artworks In The Kunsthistorischesmuseum, ViennaPräsentation Presentation2009
4Sasamori, S. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Wobrauschek, Peter ; Meirer, F. ; Mantler, C. Si Wafer Analysis Of Light Elements By Txrf - Chamber Adaption To Fit 6" And 8" WafersPräsentation Presentation2009
5Ingerle, D. ; Zöger, N. ; Wobrauschek, Peter ; Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Giubertoni, D. Spectrometer For Grazing Incidence Xrf: Characterization Of As Implants And Hf LayersPräsentation Presentation2009
6Meirer, F. ; Streli, Christina ; Wobrauschek, Peter ; Pepponi, Giancarlo ; Giubertoni, D. ; Pianetta, P. Txrf-Xanes And Gi-Xas: X-Ray Absorption Spectroscopy In Trace AnalysisPräsentation Presentation2009
7Wobrauschek, Peter Workshop on trace element analysisPräsentation Presentation2009
8Streli, Christina Workshop on trace element analysisPräsentation Presentation2009