| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Ingerle, D. ; Meirer, F. ; Zöger, N. ; Pepponi, Giancarlo ; Giubertoni, D. ; Wobrauschek, Peter ; Streli, Christina | A GIXRF laboratory insrument for the characterization of ultra shallow implants and thin films | Präsentation Presentation | 2009 |
| 2 | | Beckhoff, B. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polignano, M.L. ; Codegoni, D. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Lazzeri, P. ; Gennaro, S. ; Kolbe, M. ; Müller, M. ; Kregsamer, Peter ; Posch, F. | Assessing various analytical techniques with different lateral resolution by investigating spin-coated inorganic contamination on Si surfaces | Präsentation Presentation | 2009 |
| 3 | | Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Cazzini, E. ; Codegoni, D. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina | Comparability of TXRF Systems at different laboratories | Präsentation Presentation | 2009 |
| 4 | | Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter | Si wafer analysis of light elements by TXRF | Präsentation Presentation | 2009 |