IAEA Technical meeting on Quality assurance for Nuclear spectrometry techniques
Event name
IAEA Technical meeting on Quality assurance for Nuclear spectrometry techniques
Event type
Event for scientific audience
Start date
12-10-2009
End date
16-10-2009
Location
Wien
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Streli, Christina ; Kregsamer, Peter ; Posch, F. ; Fugger, Manfred | Accreditation for wafer surface analysis with TXRF | Präsentation Presentation | 2009 |