TXRF 2011 Conference

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Description

Event name
TXRF 2011 Conference
 
Event type
Event for scientific audience
 
Start date
07-06-2011
End date
09-06-2011
 
Location
Dortmund, Germany
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Streli, Christina
Author:  Pepponi, Giancarlo

Results 1-3 of 3 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Meirer, F. ; Pepponi, Giancarlo ; Ingerle, D. ; Sahiner, M.A. ; Giubertoni, D. ; Demenev, E. ; Foad, M.A. ; Woicik, J.C. ; Mehta, A. ; Streli, Christina ; Pianetta, P. Characterization of ultra shallow arsenic implants in silicon using grazing incidence and grazing exit x-ray spectroscopyPräsentation Presentation2011
2Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Streli, Christina ; Wobrauschek, Peter ; van den Berg, J.A. ; Reading, M.A. Combined approach of GIXRF+XRR for Characterization of thin films on Si wafersPräsentation Presentation2011
3Kregsamer, Peter ; Nutsch, A. ; Borionetti, G. ; Beckhoff, B. ; Müller, M. ; Polignano, M.L. ; Pepponi, Giancarlo ; Fittschen, U. ; Streli, Christina Round robin test for TXRF and ToF-SIMS on various types of Ni samples on Si wafer surfaces within the network ANNAPräsentation Presentation2011