TXRF 2011 Conference

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Description

Event name
TXRF 2011 Conference
 
Event type
Event for scientific audience
 
Start date
07-06-2011
End date
09-06-2011
 
Location
Dortmund, Germany
Country
Europe
 
Solo Exhibition
Solo Exhibition
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Wobrauschek, Peter

Results 1-5 of 5 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Streli, Christina ; Wobrauschek, Peter ; van den Berg, J.A. ; Reading, M.A. Combined approach of GIXRF+XRR for Characterization of thin films on Si wafersPräsentation Presentation2011
2Wastl, A. ; Bogner, B. ; Kregsamer, Peter ; Wobrauschek, Peter ; Streli, Christina Gunshot residue investigations using TXRFPräsentation Presentation2011
3Horntrich, C. ; Kregsamer, Peter ; Wobrauschek, Peter ; Nutsch, A. ; Streli, Christina Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing different sample shapesPräsentation Presentation2011
4Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Simon, R. ; Nutsch, A. ; Streli, Christina Influence of the excitation energy on absorption effects in TXRF analysisPräsentation Presentation2011
5Felling, C. ; Prost, Josef ; Wobrauschek, Peter TXRF Sepctrometer - Design with 50 W Mo tube and SDDPräsentation Presentation2011