15th Int. Conference on TXRF and related methods

View Statistics Email Alert RSS Feed

Description

Event name
15th Int. Conference on TXRF and related methods
 
Event type
Event for scientific audience
 
Start date
23-09-2013
End date
26-09-2013
 
Location
Osaka, Japan
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Ingerle, D.
Author:  Wobrauschek, Peter

Results 1-4 of 4 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schiebl, M. ; Ingerle, D. ; Streli, Christina ; Wobrauschek, Peter Characterization of thin films on Si wafers by GIXRF in combination with XRRPräsentation Presentation2013
2Rauwolf, Mirjam ; Ingerle, D. ; Pemmer, B. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, A. Low Z TXRF measurements with a new Ketek SDD detectorPräsentation Presentation2013
3Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Giubertoni, D. ; Demenev, E. ; Wobrauschek, Peter ; Streli, Christina New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRRPräsentation Presentation2013
4Rauwolf, Mirjam ; Vanhoof, Christine ; Tirez, K. ; Wobrauschek, Peter ; Ingerle, D. ; Streli, Christina TXRF measurements of S and P in proteins using a special TXRF vacuum chamber for low Z elementsPräsentation Presentation2013