X-ray metrology workshop 2018
Event name
X-ray metrology workshop 2018
Event type
Event for scientific audience
Start date
22-05-2018
End date
23-05-2018
Location
Utrecht, Netherlands
Country
Event format Veranstaltungsformat
On Site
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ingerle, D. | Grazing X-ray techniques for the nondestructive characterization of nanomaterials | Präsentation Presentation | 2018 | |
| 2 | Wobrauschek, Peter ; Streli, Christina | Quantitative X-ray fluorescence lecture | Präsentation Presentation | 2018 | |
| 3 | Wobrauschek, Peter ; Ingerle, D. ; Streli, Christina | Total reflection X-ray fluorescence and X-ray standing wave workshop | Präsentation Presentation | 2018 |