TXRF 2015

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Description

Event name
TXRF 2015
 
Event type
Event for scientific audience
 
Start date
03-08-2015
End date
07-08-2015
 
Location
Westminster, CO, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-12 of 12 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Wobrauschek, Peter ; Prost, Josef ; Ingerle, D. ; Streli, Christina A Vacuum TXRF Spectrometer with Sample Changer and Two Exchangeable Low Power Excitation SourcesPräsentation Presentation2015
2Gaita, S.M. ; Boman, J. ; Mages, M. ; Prost, Josef ; Streli, Christina ; Wagner, A. ; Gatari, M. Comparative Analysis of Airborne Particulate Matter Using TXRF and PIXE TechniquesPräsentation Presentation2015
3Caby, B. ; Detlefs, B. ; Picot, G. ; Nolot, E. ; Brigidi, Fabio ; Pepponi, Giancarlo ; Ingerle, D. ; Streli, Christina ; Lutterotti, L. ; Chateigner, D. ; Morales, M. Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence MeasurementsPräsentation Presentation2015
4Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Leani, J.J. ; Migliori, A. ; Karydas, A.G. ; Eichert, D.M. ; Jark, W. ; Zecevic, J. ; Meirer, F. Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab SpectrometerPräsentation Presentation2015
5Streli, Christina ; Ingerle, D. ; Wobrauschek, Peter Gixrf, Sr-Txrf, Srtxrf-XanesPräsentation Presentation2015
6Wobrauschek, Peter ; Streli, Christina Introduction to TXRF- InstrumentationPräsentation Presentation2015
7Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Meirer, F. JGIXA - A Software Package for the Calculation and Fitting of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data for the Characterization of Nanometer-layers and Ultra-shallow-implantsPräsentation Presentation2015
8Sanyal, K. ; Kanrar, B. ; Dhara, S. ; Misra, N.L. ; Wobrauschek, Peter ; Streli, Christina Results from a New Low-Z High-Z TXRF SpectrometerPräsentation Presentation2015
9Gotlib, Z.P. ; Fittschen, U. ; Böttger, S. ; Rosenberg, D. ; Jansen, W. ; Busker, M. ; Menzel, M. ; Guilherme, A. ; Radtke, Martin ; Riesemeier, Heinrich ; Wobrauschek, Peter ; Streli, Christina Setup and Characterization of Synchrotron Radiation Induced Total Reflection X-ray Fluorescence X-ray Absorption Near Edge Structures at BESSY II BAMLinePräsentation Presentation2015
10Menzel, M. ; Meyer, A. ; Scharf, O. ; Nowak, Sebastian ; Radtke, Martin ; Reinholz, Uwe ; Buzanich, G. ; Hischenhuber, Peter ; Streli, Christina ; Lopez, V.M. ; McIntosh, K. ; Havrilla, G.J. ; Fittschen, U. Shading in TXRF: Calculations and Experimental Validation using a Color X-ray Camera with Subpixel ResolutionPräsentation Presentation2015
11Prost, Josef ; Windbichler, A. ; Karydas, A.G. ; Sterba, Johannes H. ; Wobrauschek, Peter ; Streli, Christina Total Reflection X-ray Fluorescence Analysis of Indoor Aerosol SamplesPräsentation Presentation2015
12Streli, Christina ; Rauwolf, Mirjam ; Prost, Josef ; Ingerle, D. ; Wobrauschek, Peter TXRF of low Z elements: Developments and Applications - A ReviewPräsentation Presentation2015