17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2017)

Event name
17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2017)
 
Event type
Event for scientific audience
 
Start date
19-09-2017
End date
22-09-2017
 
Location
Brescia, Italy
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Wobrauschek, Peter
Author:  Hradil, K.

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PreviewAuthor(s)TitleTypeIssue Date
1Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Artner, W. ; Hradil, K. ; Wobrauschek, Peter ; Streli, Christina Characterization of nanomaterials with GIXRF and XRR using lab sourcesPräsentation Presentation2017