BAM 2017
Event name
BAM 2017
Event type
Event for scientific audience
Start date
10-05-2017
Location
Berlin, Germany
Country
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Wobrauschek, Peter ; Ingerle, D. ; Streli, Christina | Grazing incidence X-ray fluorescence and X-ray reflectivity for the characterization of nanometer-layers and ultra-shallow-implants using JGIXA - a software package for the calculation and fitting | Präsentation Presentation | 2017 |