IAEA technical meeting: F1-TM-52965 Trends in Analytical Applications and Instrumental Developments of Synchrotron Based X-Ray Spectrometry Techniques (2017)
Event name
IAEA technical meeting: F1-TM-52965 Trends in Analytical Applications and Instrumental Developments of Synchrotron Based X-Ray Spectrometry Techniques (2017)
Event type
Event for scientific audience
Start date
03-10-2017
Location
Vienna, Austria
Country
Austria
Event format Veranstaltungsformat
On Site
Results 1-1 of 1 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Streli, Christina ; Wobrauschek, Peter ; Ingerle, D. ; Rauwolf, Mirjam ; Turyanskaya, A. ; Prost, Josef ; Perneczky, L. ; Pepponi, Giancarlo | GIXRF, SR-TXRF-XANES and μ-XRF | Präsentation Presentation | 2017 |