Denver X-ray conference (2020)
Event name
Denver X-ray conference (2020)
Event type
Event for scientific audience
Start date
03-08-2020
End date
07-08-2020
Location
Denver, USA
Country
Event format Veranstaltungsformat
On Site
Results 1-2 of 2 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Streli, Christina ; Ingerle, D. ; Wobrauschek, Peter | Characterization of Nanomaterials with Combined GIXRF and XRR Approach | Präsentation Presentation | 2020 | |
| 2 | Fittschen, U. ; Till, H. S. ; Hampel, S. ; Gross, A. ; Kulow, A. ; Buzanich, G. ; Reinholz, Uwe ; Radtke, Martin ; Ingerle, D. ; Streli, Christina | Improving Surface Sensitive XRF Using Ink-Jet Printing and Information from the Angle Dependent Signal | Präsentation Presentation | 2020 |