Crystals

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Journal description

Title Titel
Crystals
 
e-ISSN
2073-4352
 
ISSN
2073-4352
 
Publisher Herausgeber
MDPI
 
Publisher's Address Herausgeber Adresse
ST ALBAN-ANLAGE 66, BASEL, SWITZERLAND, CH-4052
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
Listed in DOAJ Aufgelisted im DOAJ
 

Publications Publikationen

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Subject:  General Materials Science

Results 1-11 of 11 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Waltl, Michael Editorial for the Special Issue on Robust Microelectronic DevicesArtikel Article2022
2Shuvaev, Alexey ; Pan, Lei ; Zhang, Peng ; Wang, Kang L. ; Pimenov, Andrei Faraday Rotation Due to Quantum Anomalous Hall Effect in Cr-Doped (Bi,Sb)2Te3Artikel Article 2021
3Hernandez, Yoanlys ; Stampfer, Bernhard ; Grasser, Tibor ; Waltl, Michael Impact of Bias Temperature Instabilities on the Performance of Logic Inverter Circuits Using Different SiC Transistor TechnologiesArtikel Article 2021
4Kyvala, Lukas ; Tchaplianka, Maxim ; Shick, Alexander ; Khmelevskyi, Sergii ; Legut, Dominik Large Uniaxial Magnetic Anisotropy of Hexagonal Fe-Hf-Sb AlloysArtikel Article 2020
5Rameshan, Raffael ; Nenning, Andreas ; Raschhofer, Johannes ; Lindenthal, Lorenz ; Ruh, Thomas ; Summerer, Harald ; Opitz, Alexander ; Huber, Tobias ; Rameshan, Christoph Novel Sample-Stage for Combined Near Ambient Pressure X-ray Photoelectron Spectroscopy, Catalytic Characterization and Electrochemical Impedance SpectroscopyArtikel Article 2020
6Saito, Yohei ; Löhle, Anja ; Kawamoto, Atsushi ; Pustogow, Andrej ; Dressel, Martin Pressure-Tuned Superconducting Dome in Chemically-Substituted κ-(BEDT-TTF)2Cu2(CN)3Artikel Article 2021
7Tröster, Andreas ; Schranz, Wilfried ; Ehsan, Sohaib ; Belbase, Kamal ; Blaha, Peter Symmetry-Adapted Finite Strain Landau Theory Applied to KMnF₃Artikel Article 2020
8Feil, Maximilian ; Huerner, Andreas ; Puschkarsky, Katja ; Schleich, Christian ; Eichinger, Thomas ; Gustin, W. ; Reisinger, H. ; Grasser, Tibor The Impact of Interfacial Charge Trapping on the Reproducibility of Measurements of Silicon Carbide MOSFET Device ParametersArtikel Article 2020
9Weil, Matthias The Mixed-Metal Oxochromates(VI) Cd(HgI2)2(HgII)3O4(CrO4)2, Cd(HgII)4O4(CrO4) and Zn(HgII)4O4(CrO4)-Examples of the Different Crystal Chemistry within the Zinc Triad.Artikel Article 2017
10Gunasekara, Saman Nimali ; Barreneche, Camila ; Inés Fernández, A. ; Calderón, Alejandro ; Ravotti, Rebecca ; Ristić, Alenka ; Weinberger, Peter ; Ömur Paksoy, Halime ; Koçak, Burcu ; Rathgeber, Christoph ; Ningwei Chiu, Justin ; Stamatiou, Anastasia Thermal Energy Storage Materials (TESMs) - What Does It Take to Make Them Fly?Artikel Article 2021
11Pustogow, Andrej ; Dizdarevic, Daniel ; Erfort, Sebastian ; Iakutkina, Olga ; Merkl, Valentino ; Untereiner, Gabriele ; Dressel, Martin Tuning Charge Order in (TMTTF)2X by Partial Anion SubstitutionArtikel Article 2021