IEEE Transactions on Device and Materials Reliability

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Journal description

Title Titel
IEEE Transactions on Device and Materials Reliability
 
e-ISSN
1558-2574
 
ISSN
1530-4388
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Kaczer, Ben
Date Issued:  [2006 TO 2009]

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Grasser, Tibor ; Wagner, Paul-JÜrgen ; Hehenberger, Philipp ; Goes, Wolfgang ; Kaczer, Ben A Rigorous Study of Measurement Techniques for Negative Bias Temperature InstabilityArtikel Article2008
2Grasser, Tibor ; Gös, Wolfgang ; Kaczer, Ben Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport ModelsArtikel Article Mar-2008