Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models

Grasser, Tibor; Gös, Wolfgang; Kaczer, Ben

doi:10.1109/tdmr.2007.912779

Record link:

http://hdl.handle.net/20.500.12708/168621

Title:

Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models

Citation:

Grasser, T., Gös, W., & Kaczer, B. (2008). Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models. IEEE Transactions on Device and Materials Reliability, 8(1), 79–97. https://doi.org/10.1109/tdmr.2007.912779

Publisher DOI:

10.1109/tdmr.2007.912779

Publication Type:

Article - Original Research Article

Language:

English

Authors:

Grasser, Tibor
Gös, Wolfgang
Kaczer, Ben

Organisational Unit:

E360 - Institut für Mikroelektronik

Journal:

IEEE Transactions on Device and Materials Reliability

ISSN:

1530-4388

Date (published):

Mar-2008

Number of Pages:

Publisher:

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Peer reviewed:

Yes

Keywords:

Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Safety, Risk, Reliability and Quality

Research Areas:

Surfaces and Interfaces: 10%
Modelling and Simulation: 40%
Computational Materials Science: 20%
Nanoelectronics: 30%

Science Branch:

Elektrotechnik, Elektronik

Appears in Collections:

Article

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