Microelectronics Reliability

Title Titel

e-ISSN

1872-941X

ISSN

0026-2714

Publisher Herausgeber

PERGAMON-ELSEVIER SCIENCE LTD

Listed in SCI Aufgelistet im SCI

Peer reviewed Begutachtet

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Author: Grasser, Tibor

Author: Stampfer, Bernhard

Subject: Atomic and Molecular Physics, and Optics

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		Preview	Author(s)	Title	Type	Issue Date
	1		Waltl, Michael ; Waldhoer, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor	Impact of Single-Defects on the Variability of CMOS Inverter Circuits	Artikel Article	2021
	2		Waltl, Michael ; Stampfer, Bernhard ; Rzepa, Gerhard ; Kaczer, Ben ; Grasser, Tibor	Separation of Electron and Hole Trapping Components of PBTI in SiON nMOS Transistors	Artikel Article	2020