Microscopy and Microanalysis

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Journal description

Title Titel
Microscopy and Microanalysis
 
e-ISSN
1435-8115
 
ISSN
1431-9276
 
Publisher Herausgeber
OXFORD UNIV PRESS
 
Publisher's Address Herausgeber Adresse
GREAT CLARENDON ST, OXFORD, ENGLAND, OX2 6DP
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Filter:
Subject:  Instrumentation
Date Issued:  [2010 TO 2019]
Author:  Schattschneider, Peter

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Müller-Caspary, Knut ; Krause, Florian ; Béché, Armand ; Duchamp, Martial ; Schowalter, Marco ; Löffler, Stefan ; Migunov, Vadim ; Winkler, Florian ; Huth, Martin ; Ritz, Robert ; Ihle, Sebastian ; Simson, Martin ; Ryll, Henning ; Soltau, Heike ; Strüder, Lothar ; Zweck, Josef ; Schattschneider, Peter ; Dunin-Borkowski, Rafal ; Verbeeck, Johan ; Rosenauer, Andreas Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors.Artikel Article 1-Jul-2016
2Schneider, Sebastian ; Pohl, Darius ; Löffler, Stefan ; Kasinathan, Deepa ; Rusz, Jan ; Schattschneider, Peter ; Schultz, Ludwig ; Rellinghaus, Bernd Quantifying Magnetism on the nm Scale: EMCD on Individual FePt NanoparticlesArtikel Article 2016