Title Titel
Solid State Ionics
 
e-ISSN
1872-7689
 
ISSN
0167-2738
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Author:  Gerstl, Matthias

Results 1-5 of 5 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Navickas, E. ; Gerstl, M. ; Friedbacher, G. ; Kubel, F. ; Fleig, J. Measurement of the across-plane conductivity of YSZ thin films on siliconArtikel Article2012
2Gerstl, M. ; Frömling, T. ; Schintlmeister, A. ; Hutter, H. ; Fleig, J. Measurement of ¹⁸O tracer diffusion coefficients in thin yttria stabilized zirconia filmsArtikel Article2011
3Gerstl, Matthias ; Hutterer, Alexander ; Fleig, Jürgen ; Bram, Martin ; Opitz, Alexander Karl Model composite microelectrodes as a pathfinder for fully oxidic SOFC anodesArtikel Article 2016
4Gerstl, M. ; Navickas, E. ; Leitgeb, M. ; Friedbacher, G. ; Kubel, F. ; Fleig, J. The grain and grain boundary impedance of sol-gel prepared thin layers of yttria stabilized zirconia (YSZ)Artikel Article2012
5Gerstl, M. ; Navickas, E. ; Friedbacher, G. ; Kubel, F. ; Ahrens, M. ; Fleig, J. The separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layersArtikel Article2011