Title Titel
Thin Solid Films
 
e-ISSN
1879-2731
 
ISSN
0040-6090
 
Publisher Herausgeber
ELSEVIER SCIENCE SA
 
Publisher's Address Herausgeber Adresse
PO BOX 564, LAUSANNE, SWITZERLAND, 1001
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2024]

Results 41-48 of 48 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
41Radić, Nikola ; Eisenmenger-Sittner, Christoph ; Erdélyi, Zoltán ; Panjan, Peter Selected papers from 16th International Conference on Thin Films, October 13 - 16, 2014, Dubrovnik, CroatiaArtikel Article 2015
42Rumpf, K. ; Granitzer, P. ; Poelt, P. ; Reissner, M. Specific loading of porous silicon with iron oxide nanoparticles to achieve different blocking temperaturesArtikel Article2013
43Arndt, Björn ; Noei, Heshmat ; Keller, Thomas F. ; Müller, Patrick ; Vonk, Vedran ; Nenning, Andreas ; Opitz, Alexander K. ; Fleig, Jürgen ; Rütt, Uta ; Stierle, Andreas Structure and Stability of Gd-doped CeO₂ thin films on yttria-stabilized zirconiaArtikel Article 2016
44Chawla, Vipin ; Holec, David ; Mayrhofer, Paul H. The effect of interlayer composition and thickness on the stabilization of cubic AlN in AlN/Ti-Al-N superlatticesArtikel Article2014
45Grosser, M. ; Schmid, U. The impact of sputter conditions on the microstructure and on the resistivity of tantalum thin filmsArtikel Article 2009
46Raab, R. ; Koller, C.M. ; Riedl, H. ; Kolozsvári, S. ; Ramm, J. ; Mayrhofer, P.H. The influence of synthetic air flow on the properties of arc evaporated Al-Cr-O-N coatingsArtikel Article 2019
47Bohnenberger, Timo ; Rafailovic, Lidija D. ; Weilach, Christian ; Hubmayr, David ; Schmid, Ulrich Thin films from functionalized carbon nanotubes using the layer-by-layer techniqueArtikel Article 2014
48Triendl, Fabian ; Pfusterschmied, Georg ; Berger, Claudio ; Schwarz, Sabine ; Artner, Werner ; Schmid, Ulrich Ti/4H-SiC schottky barrier modulation by ultrathin a-SiC:H interface layerArtikel Article 2021