Title Titel
Ultramicroscopy
 
e-ISSN
1879-2723
 
ISSN
0304-3991
 
Publisher Herausgeber
ELSEVIER
 
Publisher's Address Herausgeber Adresse
RADARWEG 29, AMSTERDAM, Netherlands, 1043 NX
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Electronic, Optical and Magnetic Materials
Access Type:  Open Access

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PreviewAuthor(s)TitleTypeIssue Date
1Stoeger-Pollach-2020-Ultramicroscopy-vor.pdf.jpgStöger-Pollach, Michael ; Löffler, Stefan ; Maurer, Niklas ; Bukvišová, Kristýna Using Čerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceArtikel Article Jul-2020