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Record link: 
http://hdl.handle.net/20.500.12708/141651
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Title: 
Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
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Citation: 
Stöger-Pollach, M., Stöger-Pollach, M., Löffler, S., Maurer, N., & Bukvisová, K. (2020). Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. Ultramicroscopy, 214(113011), 113011. https://doi.org/10.1016/j.ultramic.2020.113011
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Publisher DOI: 
10.1016/j.ultramic.2020.113011
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Publication Type: 
Artikel - Original Research Article
de
 
Article - Original Research Article
en
Authors: 
Stöger-Pollach, Michael 
Stöger-Pollach, Michael 
Löffler, Stefan 
Maurer, Niklas 
Bukvisová, Kristýna 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
E138-03 - Forschungsbereich Functional and Magnetic Materials 
E138 - Institut für Festkörperphysik 
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Journal: 
Ultramicroscopy 
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ISSN: 
0304-3991
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Date (published): 
2020
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Number of Pages: 
5
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Peer reviewed: 
Yes
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Keywords: 
Electronic, Optical and Magnetic Materials; Atomic and Molecular Physics, and Optics; Instrumentation
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Abstract: 
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on erenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).
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Research Areas: 
Materials Characterization: 50%
Non-metallic Materials: 50%
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Science Branch: 
Physik, Astronomie
Chemie
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