Organization Name (de) Name der Organisation (de)
E376-50 - Services des Instituts
 
Code Kennzahl
E376-50
 
Type of Organization Organisationstyp
Service Research
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schitter, Georg ; Scarpas, Athanasios ; Allgöwer, F. Robust two-degree-of-freedom control of an atomic force microscopeArtikel Article 2004
2Stark, Robert ; Schitter, Georg ; Stark, Martin ; Guckenberger, Reinhard ; Stemmer, A. State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopyArtikel Article 2004
3Pernstich, K. P. ; Haas, S. ; Oberhoff, D. ; Goldmann, C. ; Gundlach, D. J. ; Batlogg, B. ; Rashid, A. N. ; Schitter, Georg Threshold voltage shift in organic FETs by dipole-monolayers on the gate insulatorArtikel Article 2004
4Schitter, Georg ; Stemmer, A. Model-based signal conditioning for high-speed atomic force and friction force microscopyArtikel Article 2003
5Stark, Robert ; Schitter, Georg ; Stemmer, A. Tuning the interaction forces in tapping mode atomic-force microscopyArtikel Article 2003
6Schitter, Georg ; Stemmer, A. Fast closed loop control of piezoelectric transducersArtikel Article 2002
7Schitter, Georg ; Menold, P- ; Knapp, H. ; Allgöwer, F. ; Stemmer, A. High performance feedback for fast scanning atomic force microscopesArtikel Article 2001