Kosina, Hans

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Kosina, Hans
 
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Subject:  electron-electron scattering
Subject:  device simulation

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PreviewAuthor(s)TitleTypeIssue Date
1Kampl Markus - 2019 - Investigating hot-carrier effects using the backward Monte...pdf.jpgKampl, Markus Investigating hot-carrier effects using the backward Monte Carlo methodThesis Hochschulschrift 2019