Name Card

Full name Familienname, Vorname
Hackl, Thomas
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-14 of 14 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Berger, Bernhard M. ; Sattler, Sebastian W. ; Schitter, Georg A contactless method for measuring amplitude and phase of RF voltages up to 26.5GHzArticle Artikel 23-Jan-2024
2Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Model-Based RF Sensing for Contactless High-Resolution Voltage MeasurementsArticle Artikel 20-Sep-2023
3Poik, Mathias ; Hackl, Thomas ; Di Martino, Stefano ; Schober, Martin ; Dang, Jin ; Schitter, Georg Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage SensingInproceedings Konferenzbeitrag13-Jul-2023
4Hackl, Thomas ; Mesquida, Patrick ; Poik, Mathias ; Schitter, Georg Ac kelvin probe force microscopy enables nanoscale surface charge mapping in waterInproceedings Konferenzbeitrag2023
5Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Quantitative Surface Potential Measurements by AC Electrostatic Force MicroscopyInproceedings Konferenzbeitrag 2023
6Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in LiquidsArticle Artikel 19-Dec-2022
7Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Electrostatic Actuation of AFM Cantilevers in Aqueous SolutionsInproceedings Konferenzbeitrag 25-Aug-2022
8Hackl, Thomas ; Poik, Mathias ; Schitter, Georg DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force MicroscopyInproceedings Konferenzbeitrag 30-Jun-2022
9Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement ModesInproceedings Konferenzbeitrag 2022
10Hackl-2022-ACS Nano-vor.pdf.jpgHackl, Thomas ; Schitter, Georg ; Mesquida, Patrick AC Kelvin Probe Force Microscopy Enables Charge Mapping in WaterArticle Artikel 2022
11Hackl, Thomas ; Poik, Mathias ; Schitter, Georg Influence of Imaging Parameters on AFM Surface Potential Measurements in Aqueous SolutionsInproceedings Konferenzbeitrag 2022
12Poik, Mathias ; Mayr, Mario ; Hackl, Thomas ; Schitter, Georg Mechatronic Demodulation of Self-Sensing Cantilever for DC-bias free AFM Imaging in LiquidInproceedings Konferenzbeitrag 2022
13Hackl, Thomas ; Poik, Matthias ; Schitter, Georg Automated Probe-Sample Alignment for the Evaluation of Integrated CircuitsKonferenzbeitrag Inproceedings 2021
14Hackl Thomas - 2020 - Automated probe-sample alignment for the evaluation of...pdf.jpgHackl, Thomas Automated probe-sample alignment for the evaluation of integrated circuitsThesis Hochschulschrift 2020