Record link: 
http://hdl.handle.net/20.500.12708/189776
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Title: 
Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water
en
Citation: 
Hackl, T., Mesquida, P., Poik, M., & Schitter, G. (2023). Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water. In Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023. Microscience Microscopy Congress 2023, Manchester, United Kingdom of Great Britain and Northern Ireland (the). https://doi.org/10.22443/rms.mmc2023.166
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Publisher DOI: 
10.22443/rms.mmc2023.166
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Publication Type: 
Inproceedings - Poster Contribution
en
Language: 
English
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Authors: 
Hackl, Thomas 
Mesquida, Patrick 
Poik, Mathias 
Schitter, Georg 
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Organisational Unit: 
E376-01 - Forschungsbereich Intelligente Mechatronische Systeme 
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Published in: 
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023 
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Date (published): 
2023
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Event name: 
Microscience Microscopy Congress 2023 
en
Event date: 
4-Jul-2023 - 6-Jul-2023
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Event place: 
Manchester, United Kingdom of Great Britain and Northern Ireland (the)
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Number of Pages: 
1
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Keywords: 
AC-KPFM; surface charge; atomic force microscopy; microcontact printing; self-assembled monolayer; solid−liquid interface
en
Project (external): 
FWF
FFG
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Project ID: 
P 31238-N28
883916
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Research Areas: 
Mathematical and Algorithmic Foundations: 50%
Sensor Systems: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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