<div class="csl-bib-body">
<div class="csl-entry">Hackl, T., Mesquida, P., Poik, M., & Schitter, G. (2023). Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water. In <i>Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023</i>. Microscience Microscopy Congress 2023, Manchester, United Kingdom of Great Britain and Northern Ireland (the). https://doi.org/10.22443/rms.mmc2023.166</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/189776
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dc.language.iso
en
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dc.subject
AC-KPFM
en
dc.subject
surface charge
en
dc.subject
atomic force microscopy
en
dc.subject
microcontact printing
en
dc.subject
self-assembled monolayer
en
dc.subject
solid−liquid interface
en
dc.title
Ac kelvin probe force microscopy enables nanoscale surface charge mapping in water
en
dc.type
Inproceedings
en
dc.type
Konferenzbeitrag
de
dc.type.category
Poster Contribution
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tuw.booktitle
Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023
