Full name Familienname, Vorname
Stöger-Pollach, Michael
 
 


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Subject:  EELS
Date Issued:  [2006 TO 2009]

Results 1-7 of 7 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Penner, Simon ; Lorenz, Harald ; Klötzer, Bernhard ; Stöger-Pollach, Michael ; Lebedev, Oleg ; Turner, Stuart Electron-microscopic characterization of pure oxide methanol steam reforming catalystsKonferenzbeitrag Inproceedings2009
2Stöger-Pollach, Michael ; Schattschneider, Peter ; Perkins, J. ; McComb, D. EMCD at high spatial resolution: comparison of STEM with EELS profilingKonferenzbeitrag Inproceedings2008
3Stöger-Pollach, Michael About the determination of optical properties using fast electronsKonferenzbeitrag Inproceedings2008
4Schwarz, Sabine ; Stöger-Pollach, Michael EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and MgKonferenzbeitrag Inproceedings2008
5Stöger-Pollach, M. Optical properties and bandgaps from low loss EELS: Pitfalls and solutionsArtikel Article2008
6Stöger-Pollach, M. ; Laister, A. ; Schattschneider, P. Treating retardation effects in valence EELS spectra for Kramers-Kronig analysisArtikel Article 2008
7Stöger-Pollach, M. ; Schattschneider, P. The influence of relativistic energy losses on bandgap determination using valence EELSArtikel Article Nov-2007



Filter:
Subject:  EELS
Date Issued:  [2006 TO 2009]

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Laister, Anita Maria Removal of relativistic effects in the low loss region of electron energy loss spectraThesis Hochschulschrift2007