Full name Familienname, Vorname
Rödiger, Peter
 
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Results 1-20 of 22 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödiger, Peter ; Bertagnolli, Emmerich Focused Electron Beam Induced Etching - Advantages, Features & Limitations of FEBIE with ChlorineKonferenzbeitrag Inproceedings2015
2Zeiner, Clemens ; Lugstein, Alois ; Rödiger, Peter ; Mijic, Mario ; den Hertog, Martien ; Prager, Aaron ; Defranceschi, Silvano ; Bertagnolli, Emmerich Surface doping of Germanium NanowiresPräsentation Presentation2013
3Wanzenböck, Heinz D. ; Ismail, Bassem ; Rödiger, Peter ; Greil, Johannes Maximilian ; Hetzel, Martin ; Lugstein, Alois ; Bertagnolli, Emmerich Engineering electrical properties of Silicon nanowires by focused electron beam induced processing with ChlorinePräsentation Presentation2012
4Rödiger, Peter A non-destructive, direct-write focused electron beam induced etching process for semiconductors featuring nanometer precisionThesis Hochschulschrift2011
5Wanzenböck, Heinz D. ; Rödiger, Peter ; Waid, Simon ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Focused Beam Induced Etching - Making the Right Choice Between Ions and ElectronsPräsentation Presentation2011
6Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Etching of Germanium by Chlorine Gas using a Focused Electron BeamPräsentation Presentation2011
7Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Waid, Simon ; Bertagnolli, Emmerich Removal of FIB-Induced Amorphization and Gallium Contamination by Focused-Electron-Beam-Induced-EtchingPräsentation Presentation2011
8Rödiger, Peter ; Wanzenböck, Heinz D. Hydrocarbonaceous Contamination in SEMs: Evaluation and RemovalPräsentation Presentation2011
9Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Lugstein, Alois ; Bertagnolli, Emmerich Local, Direct-Write, Damage-Free Thinning of Germanium NanowiresPräsentation Presentation2011
10Rödiger, Peter ; Wanzenböck, Heinz D. Contamination avoidance - the key to focused electron beam induced etchingPräsentation Presentation2011
11Rödiger, Peter Progress report on Focused electron beam induced processingPräsentation Presentation2011
12Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Experimental evaluation of gas-flux distribution with gas injection systems for focused beam induced depositionKonferenzbeitrag Inproceedings2010
13Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Thermally assisted focused electron beam induced depositionKonferenzbeitrag Inproceedings2010
14Hochleitner, Gottfried ; Lugstein, Alois ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Nanowire Synthesis on catalyst arrays produced with electron beam induced depositionKonferenzbeitrag Inproceedings2010
15Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich New Approach for Cleaning a SEM Chamber from Hydrocarbon ContaminationPräsentation Presentation2010
16Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Electron beam induced etching of silicon using chlorine gasPräsentation Presentation2010
17Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Etching of Silicon by Chlorine Gas using a Focused Electron BeamPräsentation Presentation2010
18Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Evaluation of chamber contamination in a scanning electron microscopeArtikel Article 2009
19Wanzenböck, Heinz D. ; Rödiger, Peter ; Hörtlackner, Michael ; Bertagnolli, Emmerich Analysis and evaluation process for quantification of residual gas deposition by a focused electron beamPräsentation Presentation2009
20Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Rödiger, Peter ; Bertagnolli, Emmerich Direct-Write Deposition of Fe and Co NanostructuresPräsentation Presentation2008