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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Feil, Maximilian W. ; Weger, M. ; Reisinger, Hans ; Aichinger, Thomas ; Kabakow, André ; Waldhör, Dominic ; Jakowetz, Andreas C. ; Prigann, Sven ; Pobegen, Gregor ; Gustin, Wolfgang ; Waltl, Michael ; Bockstedte, Michel ; Grasser, Tibor | Time-gated optical spectroscopy of field-effect-stimulated recombination via interfacial point defects in fully processed silicon carbide power MOSFETs | Article Artikel  | 30-Aug-2024 |
| 2 | | Feil, Maximilian ; Waschneck, Katja ; Reisinger, Hans ; Berens, Judith ; Aichinger, Thomas ; Prigann, Sven ; Pobegen, Gregor ; Salmen, Paul ; Rescher, Gerald ; Waldhör, Dominic ; Vasilev, Alexander ; Gustin, Wolfgang ; Waltl, Michael ; Grasser, Tibor | Gate Switching Instability in Silicon Carbide MOSFETs—Part I: Experimental | Article Artikel | Jul-2024 |
| 3 | | Prigann, Sven ; Feil, Maximilian Wolfgang ; Reisinger, Hans ; Bissinger, Jochen ; Strasser, Marc ; Waltl, Michael ; Schlipf, Johannes ; Kaya, Turgay ; Bartholomäus, Lars ; Gustin, Wolfgang ; Basler, Thomas | Prompt Shift of On-State Resistance in LDMOS Devices: Causes, Recovery, and Reliability Implications | Inproceedings Konferenzbeitrag | 2024 |
