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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Streli, Christina ; Wobrauschek, Peter ; Fabry, L. ; Pahlke, S. ; Comin, F. ; Barrett, R. ; Pianetta, P. ; Lüning, K. ; Beckhoff, B. | Total-Reflection X-Ray Fluorescence (TXRF) Wafer Analysis | Buchbeitrag Book Contribution | 2006 |
| 2 | | Streli, Christina ; Wobrauschek, Peter ; Jokubonis, C. ; Pepponi, Giancarlo ; Mantler, Michael ; Fabry, L. ; Falkenberg, G. | Investigation of Cu-Gettering on Si wafer structures using SR-muXRF | Bericht Report | 2005 |
| 3 | | Wobrauschek, Peter ; Osmic, F. ; Streli, Christina ; Pahlke, S. ; Fabry, L. | Si drift detector versus Si(Li) detector for TXRF applications | Präsentation Presentation | 2002 |
| 4 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. | Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3 | Präsentation Presentation | 2002 |
| 5 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. | Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator PGB Beamline at BESSYII | Präsentation Presentation | 2002 |
| 6 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. | Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated Wafers | Präsentation Presentation | 2002 |
| 7 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. | Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3: Surface Contaminations and Depth Profiles | Präsentation Presentation | 2002 |
| 8 | | Osmic, F. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, S. ; Fabry, L. | A Si Drift Detector and a Si(Li) Detector in a TXRF Spectrometer for Wafer Analysis: A Comparison | Präsentation Presentation | 2002 |
| 9 | | Ehmann, T. ; Pepponi, Giancarlo ; Beckhoff, B. ; Fabry, L. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. | Investigation of organic Contaminations on Si Wafers by TXRF-NEXAFS | Präsentation Presentation | 2002 |
| 10 | | Osmic, F. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, S. ; Fabry, L. | Comparison of a Si drift detector with a Si(Li) detector in a TXRF spectrometer for wafer analysis | Präsentation Presentation | 2002 |
| 11 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. | Synchrotron radiation induced TXRF of low Z elements at the PTB undulator beamline at BESSY II: analysis of Si wafer surfaces | Präsentation Presentation | 2002 |
| 12 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. | Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3 | Präsentation Presentation | 2002 |
| 13 | | Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. ; Fabry, L. | Analysis of intentionally contaminated Si Wafers with TXRF-NEXAFS | Präsentation Presentation | 2002 |
| 14 | | Pepponi, Giancarlo ; Streli, Christina ; Beckhoff, B. ; Ulm, G. ; Ehmann, T. ; Pahlke, S. ; Fabry, L. | NEXAFS Spectroscopy of Organic Contamination on Si Wafers by TXRF | Präsentation Presentation | 2002 |
| 15 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. | Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF of low Z Elements at the PTB Undulator Beamline at BESSY | Präsentation Presentation | 2002 |
| 16 | | Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Ulm, G. ; Streli, Christina ; Pahlke, S. ; Fabry, L. | NEXAFS Spectroscopy of organic Contamination on Si Wafers by TXRF: First Results | Präsentation Presentation | 2002 |
| 17 | | Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. | Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator Beamline at BESSY II - recent Results | Präsentation Presentation | 2002 |
