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Palmetshofer, L.
 

Own Publications Eigene Publikationen

Results 1-9 of 9 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Rüdenauer, Friedrich ; Hobler, Gerhard ; Mitterauer, Johannes ; Koops, H.W.P. ; Palmetshofer, L. ; Bluhm, H. Ion beam devices for material processing and analysisBuchbeitrag Book Contribution2008
2Pongratz, Peter ; Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. Analysis of Experimental TEM Image Contrast of Amorphous Pockets using Molecular Dynamics Computer Simulations aof Collision Cascades in SiliconPräsentation Presentation2007
3Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. ; Pongratz, Peter Amorphous pockets in Si: Comparison of coupled molecular dynamics and TEM image contrast simulations with experimental resultsArtikel Article2007
4Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. ; Pongratz, Peter Verification of MD Results on Amorphous Pockets in Si using TEM Image Contrast SimulationsPräsentation Presentation2006
5Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. ; Pongratz, Peter Comparison of TEM image contrast simulations of amorphous pockets in Si as obtained by molecular dynamics simulations with experimental resultsPräsentation Presentation2006
6Otto, G. ; Hobler, G. ; Pongratz, P. ; Palmetshofer, L. Is there an influence of ion-beam-induced interfacial amorphization on the a/c-interface depth in silicon at common implantation energies?Artikel Article2006
7Otto, Gustav ; Hobler, Gerhard ; Palmetshofer, L. ; Mayerhofer, Karl Emanuel ; Piplits, Kurt ; Hutter, Herbert Dose-rate dependence of damage formation in Si by N implantation as determined from channeling profile measurementsArtikel Article2006
8Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Kanngießer, B. ; Malzer, W. ; Palmetshofer, L. Measurements of light Element Implants in Si Wafers with SR-TXRFPräsentation Presentation2002
9Palmetshofer, L. ; Gritsch, Martin ; Hobler, Gerhard Range ot ion-implanted rare earth element in Si and Si02Präsentation Presentation2000