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Zaitz, M.A.
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation Induced Total Reflection X-Ray Fluorescence Analysis-Xanes (SRTXRF-XANES)Präsentation Presentation2008
2Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation induced TXRF absorption spectroscopyPräsentation Presentation2008
3Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation Induced Total Reflection X-Ray Fluorescence Analysis-Xanes (SRTXRF-XANES)Bericht Report2008
4Meirer, F. ; Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Horntrich, C. ; Zaitz, M.A. ; Falkenberg, G. Characterization of iron-contaminations on silicon wafer surfaceBericht Report2008
5Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron radiation induced Total Reflection X-ray Fluorescence Analysis-absorption spectroscopy (SRTXRF-XAS)Präsentation Presentation2008
6Meirer, F. ; Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Horntrich, C. ; Zaitz, M.A. ; Falkenberg, G. Determination of the Oxidation State of Iron-Contaminations on Silicon Wafer Surfaces with K-Edge TXRF XanesPräsentation Presentation2007
7Meirer, F. ; Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Horntrich, C. ; Zaitz, M.A. ; Falkenberg, G. K-edge TXRF XANES measurements of Fecontaminations on Si wafer surfaces for determination of their oxidation statePräsentation Presentation2007