Record link: 
http://hdl.handle.net/20.500.12708/126713
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Title: 
K-edge TXRF XANES measurements of Fecontaminations on Si wafer surfaces for determination of their oxidation state
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Citation: 
Meirer, F., Streli, C., Pepponi, G., Wobrauschek, P., Horntrich, C., Zaitz, M. A., & Falkenberg, G. (2007). K-edge TXRF XANES measurements of Fecontaminations on Si wafer surfaces for determination of their oxidation state. 57. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Krems, Austria. http://hdl.handle.net/20.500.12708/126713
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Publication Type: 
Presentation - Poster Presentation
en
Authors: 
Meirer, F. 
Streli, Christina 
Pepponi, Giancarlo 
Wobrauschek, Peter 
Horntrich, C. 
Zaitz, M.A. 
Falkenberg, G. 
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Organisational Unit: 
E141-05 - Forschungsbereich Radiation Physics 
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Date (published): 
2007
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Event name: 
57. Jahrestagung der Österreichischen Physikalischen Gesellschaft 
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Event date: 
24-Sep-2007 - 28-Sep-2007
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Event place: 
Krems, Austria
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Science Branch: 
Physik, Mechanik, Astronomie
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Appears in Collections:
Presentation

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