Forschungsbereich Radiation Physics

Organization Name (de) Name der Organisation (de)
E141-05 - Forschungsbereich Radiation Physics
 
Code Kennzahl
E141-05
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 1-20 of 1769 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Weinberger, M. ; Queralt, I. ; Streli, C. ; Wobrauschek, P. ; Besalú, E. ; Jablan, J. ; Marguí, E. Critical evaluation of energy dispersive X-ray fluorescence spectrometry for multielemental analysis of coffee samples: Sample preparation, quantification and chemometric approachesArticle Artikel May-2024
2Allegretta, Ignazio ; Krstajic, Dragic ; Wobrauschek, Peter ; Kregsamer, Peter ; Ingerle, Dieter ; Streli, Christina ; Porfido, Carlo ; Terzano, Roberto Implementing light elements detection and quantification in aluminosilicate materials using a Low-Z total-reflection X-ray fluorescence spectrometerArticle Artikel Apr-2024
3Cakir, Cafer Tufan ; Bogoclu, Can ; Emmerling, Franziska ; Streli, Christina ; Guilherme Buzanich, Ana ; Radtke, Martin Machine learning for efficient grazing-exit x-ray absorption near edge structure spectroscopy analysis: Bayesian optimization approachArticle Artikel 2024
4Wobrauschek, Peter ; Ingerle, Dieter ; Prost, Josef ; Dhara, Sangita ; Mishra, Nand Lal ; Iro, Michael ; Streli, Christina A new compact micro‐XRF spectrometer with polychromatic x‐ray sample excitationArticle Artikel 3-Dec-2023
5Riehle-2023-Journal of Archaeological Science Reports-vor.pdf.jpgRiehle, Kai ; Kistler, Erich ; Öhlinger, Birgit ; Sterba, Johannes H. ; Mommsen, Hans Mirroring Mediterraneanization: Pottery production at Archaic Monte Iato, Western Sicily (6th to 5th century BCE)Article Artikel Oct-2023
6Allegretta, Ignazio ; Krstajic, D. ; Wobrauschek, Peter ; Kregsamer, Peter ; Ingerle, Dieter ; Streli, Christina ; Porfido, C. ; Terzano, R. A new strategy for the quantification of light elements (F-Fe) in aluminosilicates via a Low-Z TXRF spectrometerPresentation Vortrag7-Sep-2023
7Cakir, Cafer Tufan ; Buzanich, A. G. ; Reinholz, U. ; Streli, Christina ; Radtke, M. Enhancing Surface Analysis and Data Collection Efficiency using GE-XANES and Machine Learning: A Synchrotron-Based StudyPresentation Vortrag7-Sep-2023
8Kregsamer, Peter ; Fenninger, Lukas Josef ; Wobrauschek, Peter ; Streli, Christina A comprehensive uncertainty budget asessment for a TXRF spectrometer Atomika 8030CPresentation Vortrag6-Sep-2023
9Streli, Christina ; Kregsamer, Peter ; Eder, Dominik ; Ayala Leiva, Pablo Rony Alberto TXRF as a powerful tool for investigating emerging catalysis materials.Presentation Vortrag6-Sep-2023
10Weinberger, Mathias ; Wobrauschek, Peter ; Kregsamer, Peter ; Margui, Eva ; Jablan, Jasna ; Streli, Christina Total-reflection X-ray fluorescence analysis of coffee samplesPresentation Vortrag6-Sep-2023
11Ziegler, Philipp ; Weinberger, Matthias ; Krstajic, Dragic ; Ingerle, Dieter ; Wobrauschek, Peter ; Streli, Christina Tackling low Z element quantification with TXRFPresentation Vortrag6-Sep-2023
12Siebers, Kirsten ; Brouwer, A.C.M. ; Ingerle, Dieter ; Wobrauschek, Peter ; Streli, Christina ; Meirer, Florian Surface Functionalization for Advanced Sample Preparation in TXRFPresentation Vortrag5-Sep-2023
13Ingerle, Dieter ; Meirer, Florian ; Siebers, Kirsten ; Wobrauschek, Peter ; Streli, Christina GIMOXS- a new spectrometer for GIXRF for the nondestructive characterization of light element containing nanomaterials in the laboratoryPresentation Vortrag5-Sep-2023
14Wobrauschek, Peter Micro XRF and SynchrotronPresentation Vortrag11-Aug-2023
15Frank, Arno ; Ingerle, Dieter ; Hradil, Klaudia ; Streli, Christina ; Cook, P. ; Lichtenegger, H. ; Kerber, M. ; Hartmann, R. First Results with the X-ray Color Camera MicroscopePresentation Vortrag9-Aug-2023
16Wobrauschek, Peter ; Takahashi, Gakuto ; Streli, Christina ; Tsuji, Kouichi XRF Trace AnalysisPresentation Vortrag8-Aug-2023
17Ingerle, Dieter Grazing X-ray techniques for the nondestructive characterization of layered materialsPresentation Vortrag8-Aug-2023
18Hradil, Klaudia Grazing incidence X-ray diffraction (GIXD)Presentation Vortrag8-Aug-2023
19Streli, Christina Layered structures confocal μ-XRFPresentation Vortrag8-Aug-2023
20Wobrauschek, Peter ; Streli, Christina Energy dispersive XRFPresentation Vortrag7-Aug-2023