Kraus, P., Wobrauschek, P., Kregsamer, P., Streli, C., & Ingerle, D. (2024, August 10). MAXI- macro XRF Scanning Device with mm Spot Size for A4 Area Scans [Conference Presentation]. Denver X-ray Conference, 2024, Westminster,, US, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/209030
A macro-XRF scanning device for areas up to paper size A4 (197mm x 310mm) was designed. An end window X-ray tube 4W air cooled (AMPTEK Mini-X) with Rh or Ag anode is the compact light weight source, easily exchangeable and equipped with control electronics via USB to PC. The Peltier cooled SDD (KETEK 150 mm2) is collecting the induced fluorescence radiation in the conventional 45°-45° geometry between source, sample and detector. Both - source and detector - are mounted in an Al measuring head housing also a CCD camera looking directly from the top on the surface of the sample. In addition, 2 lasers allow to localize the beamspot on the sample. By adiusting the height of the measuring head, the 2 laser spots are matching at the x-ray beamspot on the sample. This process is automated and corrects for slight curvature of the sample surface. Laser intensity and sample illumination can be adiusted according to type of sample for best visibility of the sample. An additional laser is used to prevent the system from possible collisions with the sample, based on low cost components. The scans can be performed via an x-y stage and stepper motors controlled by the software developed in house. A set of collimators with 1, 2 or 3 mm diameter allow to change the required spatial resolution. The setup is mounted on a breadboard and can be transported out of the lab to a client. Possible applications are cultural heritage or technical samples. Scans were performed on several samples to check spatial resolution on standard patterns. Data evaluation and results will be presented.