Drews, A., & Wobrauschek, P. (2024, July 5). Workshop: XRF basics [Conference Presentation]. Denver X-ray Conference 2024, Westminster, USA, Westminster, United States of America (the). http://hdl.handle.net/20.500.12708/209307
This workshop provides a basic introduction to the principles of XRF specifically aimed at those new to the field. In the first half, there will be a general overview of the XRF technique, including a discussion of the basic principles of X-ray interactions with matter. The emphasis in the first half will be on understanding the underlying physical phenomena, how the technique is applied, optimization of the signal, and approaches to quantitative analysis. In the second half of the workshop, examples of real-world applications will be presented to illustrate some of the challenges and opportunities that the analyst may face. This half will include a description of a variety of specimen formats and the flexibility of the XRF technique, including a discussion of the capabilities of bench-top EDX instruments, micro analyzers, Total Reflection XRF (TXRF) instruments, and handheld analyzers.
