<div class="csl-bib-body">
<div class="csl-entry">Meirer, F., Streli, C., Pepponi, G., Wobrauschek, P., Horntrich, C., Zaitz, M. A., & Falkenberg, G. (2007). <i>K-edge TXRF XANES measurements of Fecontaminations on Si wafer surfaces for determination of their oxidation state</i>. 57. Jahrestagung der Österreichischen Physikalischen Gesellschaft, Krems, Austria. http://hdl.handle.net/20.500.12708/126713</div>
</div>
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dc.identifier.uri
http://hdl.handle.net/20.500.12708/126713
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dc.title
K-edge TXRF XANES measurements of Fecontaminations on Si wafer surfaces for determination of their oxidation state
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dc.type
Präsentation
de
dc.type
Presentation
en
dc.type.category
Poster Presentation
-
tuw.peerreviewed
false
-
tuw.publication.orgunit
E141-05 - Forschungsbereich Radiation Physics
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tuw.event.name
57. Jahrestagung der Österreichischen Physikalischen Gesellschaft