Name Card

Full name Familienname, Vorname
Humlicek, J.
 

Own Publications Eigene Publikationen

Results 1-6 of 6 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Eitzinger, C. ; Fikar, J. ; Forsich, Christian ; Humlicek, J. ; Krüger, A. ; Kullmer, R. ; Laimer, Johann ; Lingenhöle, E. ; Lingenhöle, K. ; Mühlberger, M. ; Müller, T. ; Störi, Herbert ; Wielsch, U. Spectroscopic Ellipsometry as a Tool for On-Line Monitoring and Control of Surface Treatment ProcessesArtikel Article2006
2Laimer, Johann ; Forsich, Christian ; Humlicek, J. ; Störi, Herbert Closed Loop Control of a Plasma Nitriding Process by Spectroscopic EllipsometryKonferenzbeitrag Inproceedings2006
3Forsich, Christian ; Gebeshuber, I.C. ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. Spectroscopic ellipsometry as an in-situ diagnostic tool for the avoidance of compound layer formation during plasma nitridingKonferenzbeitrag Inproceedings2005
4Forsich, Christian ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. On the spectroscopic ellipsometry for monitoring of diamond-like carbon (DLC) growth during plasma-assisted chemical vapour deposition (PACVD)Konferenzbeitrag Inproceedings2005
5Forsich, Christian ; Kolm, Ralph ; Tomastik, Christian ; Laimer, Johann ; Störi, Herbert ; Humlicek, J. Control of the composition of titanium nitride coatings during plasma-assisted chemical vapour deposition by spectroscopic ellipsometryKonferenzbeitrag Inproceedings2005
6Humlicek, J. Ellipsometry: broadband and fast polarization spectroscopyPräsentation Presentation2003