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Full name Familienname, Vorname
Gustin, W.
 

Own Publications Eigene Publikationen

Results 1-19 of 19 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Feil, M. W. ; Puschkarsky, K. ; Gustin, W. ; Reisinger, H. ; Grasser, T. On the Physical Meaning of Single-Value Activation Energies for BTI in Si and SiC MOSFET DevicesArtikel Article 2021
2Feil, Maximilian ; Huerner, Andreas ; Puschkarsky, Katja ; Schleich, Christian ; Eichinger, Thomas ; Gustin, W. ; Reisinger, H. ; Grasser, Tibor The Impact of Interfacial Charge Trapping on the Reproducibility of Measurements of Silicon Carbide MOSFET Device ParametersArtikel Article 2020
3Puschkarsky, K. ; Grasser, T. ; Aichinger, T. ; Gustin, W. ; Reisinger, H. Review on SiC MOSFETs High-Voltage Device Reliability Focusing on Threshold Voltage InstabilityArtikel Article 2019
4Puschkarsky, Katja ; Reisinger, H. ; Rott, Gunnar Andreas ; Schluender, C ; Gustin, W. ; Grasser, Tibor An Efficient Analog Compact NBTI Model for Stress and Recovery Based on Activation Energy MapsArtikel Article 2019
5Puschkarsky, Katja ; Reisinger, H. ; Schlünder, C. ; Gustin, W. ; Grasser, Tibor Fast Acquisition of Activation Energy Maps Using Temperature Ramps for Lifetime Modeling of BTIKonferenzbeitrag Inproceedings 2018
6Puschkarsky, Katja ; Grasser, Tibor ; Aichinger, T. ; Gustin, W. ; Reisinger, H. Understanding and Modeling Transient Threshold Voltage Instabilities in SiC MOSFETsKonferenzbeitrag Inproceedings 2018
7Puschkarsky, Katja ; Reisinger, H. ; Aichinger, T. ; Gustin, W. ; Grasser, Tibor Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit OperationKonferenzbeitrag Inproceedings2017
8Giering, K.-U. ; Rott, G. ; Rzepa, G. ; Reisinger, H. ; Puppala, A.K. ; Reich, T. ; Gustin, W. ; Grasser, T. ; Jancke, R. Analog-circuit NBTI degradation and time-dependent NBTI variability: An efficient physics-based compact modelKonferenzbeitrag Inproceedings2016
9Rott, Gunnar Andreas ; Rott, K. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel TransistorsKonferenzbeitrag Inproceedings2014
10Rott, Gunnar Andreas ; Nielen, H. ; Reisinger, H. ; Gustin, W. ; Tyaginov, S. E. ; Grasser, Tibor Drift Compensating Effect during Hot-Carrier Degradation of 130nm Dual Gate Oxide p-channel TransistorsKonferenzbeitrag Inproceedings2013
11Rott, K. ; Reisinger, H. ; Aresu, S. ; Schlünder, C. ; Kölpin, K. ; Gustin, W. ; Grasser, T. New Insights on the PBTI Phenomena in SiON pMOSFETsArtikel Article2012
12Rott, K. ; Schmitt-Landsiedel, D. ; Reisinger, H. ; Rott, Gunnar Andreas ; Georgakos, G ; Schluender, C ; Aresu, S. ; Gustin, W. ; Grasser, Tibor Impact and measurement of short term threshold instabilities in MOSFETs of analog circuitsKonferenzbeitrag Inproceedings2012
13Reisinger, H. ; Grasser, Tibor ; Ermisch, K. ; Nielen, H. ; Gustin, W. ; Schlünder, C. Understanding and Modeling AC BTIKonferenzbeitrag Inproceedings2011
14Schlünder, C. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor A New Physics-Based NBTI Model for DC-and AC-Stress Enabling Accurate Circuit Aging Simulations Considering RecoveryKonferenzbeitrag Inproceedings2010
15Reisinger, H. ; Grasser, Tibor ; Schlunder, C. ; Gustin, W. The Statistical Analysis of Individual Defects constituting NBTI and its Implications for Modeling DC- and AC-StressKonferenzbeitrag Inproceedings2010
16Reisinger, H. ; Grasser, Tibor ; Hofmann, K. ; Gustin, W. ; Schlünder, C. The impact of recovery on BTI reliability assessmentsKonferenzbeitrag Inproceedings2010
17Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided OxidesArtikel Article 2009
18Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. The Effect of Recovery on NBTI Characterization of Thick Non-Nitrided OxidesKonferenzbeitrag Inproceedings2008
19Grasser, Tibor ; Kaczer, Ben ; Hehenberger, Philipp Paul ; Gös, Wolfgang ; Connor, R. ; Reisinger, H. ; Gustin, W. ; Schlünder, C. Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature InstabilityKonferenzbeitrag Inproceedings2007