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Isakov, D. V.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Illarionov, Yury ; Vexler, M. I. ; Fedorov, V. V. ; Suturin, S. M. ; Isakov, D. V. ; Grekhov, I.V. Optical characterization of the injection properties of MIS structures with thin CaF2 and HfO2/SiO2 insulating layers on SiliconKonferenzbeitrag Inproceedings2013
2Vexler, M. I. ; Tyaginov, S. E. ; Illarionov, Yu. Yu. ; Sing, Yew Kwang ; Shenp, Ang Diing ; Fedorov, V. V. ; Isakov, D. V. A General Simulation Procedure for the Electrical Characteristics of Metal Insulator Semiconductor Tunnel StructuresArtikel Article2013