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Smith, A.D.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M.C. ; Grasser, Tibor	Impact of hot carrier stress on the defect density and mobility in double-gated graphene field-effect transistors	Konferenzbeitrag Inproceedings	2015
	2		Illarionov, Yu. Yu. ; Waltl, M. ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Mueller, T. ; Lemme, M.C. ; Grasser, T.	Hot-carrier degradation in single-layer double-gated graphene field-effect transistors	Konferenzbeitrag Inproceedings	2015
	3		Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M.C. ; Grasser, Tibor	Temperature Dependence of Hot Carrier and Positive Bias Stress Degradation in Double-Gated Graphene Field-Effect Transistors	Konferenzbeitrag Inproceedings	2015
	4		Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M ; Grasser, Tibor	Back Gate Bias-Temperature Instability in Single-Layer Double-Gated Graphene Field-Effect Transistors	Konferenzbeitrag Inproceedings	2015
	5		Illarionov, Yury ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Müller, Thomas ; Lemme, M.C. ; Grasser, Tibor	Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: A Reliability Challenge	Konferenzbeitrag Inproceedings	2014