Full name Familienname, Vorname
Stöber, Laura
 
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Results 1-8 of 8 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schneider, Michael ; Stöber, Laura ; Konrath, Jens P. ; Patocka, Florian ; Schmid, Ulrich Argon bombardment of 4H silicon carbide substrates for tailored Schottky diode barrier heightsArtikel Article 2019
2Stöber, Laura ; Konrath, J.P. ; Patocka, Florian ; Schneider, Michael ; Schmid, Ulrich Controlling 4H-SiC Schottky Barriers by Molybdenum and Molybdenum Nitride as Contact MaterialsArtikel Article Feb-2016
3Stöber, Laura Surface preconditioning and contact metallisation for 4H-SiC Schottky diodesThesis Hochschulschrift2016
4Stöber, Laura ; Konrath, Jens Peter ; Haberl, Verena ; Patocka, Florian ; Schneider, Michael ; Schmid, Ulrich Nitrogen incorporation in sputter deposited molybdenum nitride thin filmsArtikel Article 2016
5Stöber, L ; Konrath, J P ; Krivec, S ; Patocka, F ; Schwarz, S ; Bittner, A ; Schneider, M ; Schmid, U Impact of sputter deposition parameters on molybdenum nitride thin film propertiesArtikel Article2015
6Stöber, Laura ; Konrath, J.P. ; Haberl, Veronika ; Schneider, Michael ; Schmid, Ulrich High Temperature Behaviour of Sputter Deposited Molybdenum Nitride Thin FilmsKonferenzbeitrag Inproceedings2015
7Stöber, Laura ; Schneider, Michael ; Schmid, Ulrich Impact of Contact Material Deposition Technique on the Properties of Ti/4H-SiC Schottky StructuresKonferenzbeitrag Inproceedings 2015
8Stöber, Laura ; Konrath, J.P. ; Schneider, Michael ; Schmid, Ulrich Usability of Molybdenum and Molybdenum Nitride Thin Films for Microsystem ApplicationsKonferenzbeitrag Inproceedings2014

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Patocka, Florian Kelvin Probe Force Microscopy-Messungen an Hochleistungsmaterialien der LeistungselektronikThesis Hochschulschrift2015