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Shluger, A.L.
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Strand, Jack ; Moloud, Kaviani ; Gao, David ; El-Sayed, Al-Moatasem Bellah ; Afanas´Ev, V. ; Shluger, A.L. Intrinsic Charge Trapping in Amorphous Oxide Films: Status and ChallengesArtikel Article 15-May-2018
2Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Rzepa, G. ; Jech, M. ; Shluger, A.L. ; Grasser, T. Identification of Oxide Defects in Semiconductor Devices: A Systematic Approach Linking DFT to Rate Equations and Experimental EvidenceArtikel Article 2018
3Wimmer, Y. ; Goes, W. ; El-Sayed, A.-M. ; Shluger, A.L. ; Grasser, T. A density-functional study of defect volatility in amorphous silicon dioxideKonferenzbeitrag Inproceedings2015
4Grasser, T. ; Waltl, M. ; Goes, W. ; Wimmer, Y. ; El-Sayed, Al-Moatasem Bellah ; Shluger, A.L. ; Kaczer, B. On the volatility of oxide defects: Activation, deactivation, and transformationKonferenzbeitrag Inproceedings2015
5Grasser, T. ; Goes, W. ; Wimmer, Y. ; Schanovsky, F. ; Rzepa, G. ; Waltl, M. ; Rott, K. ; Reisinger, H. ; Afanas'ev, V.V. ; Stesmans, A. ; El-Sayed, Al-Moatasem Bellah ; Shluger, A.L. On the microscopic structure of hole traps in pMOSFETsKonferenzbeitrag Inproceedings2014